Характеристика наноструктурованих включень In6Se7 у шаруватих кристалах α-In2Se3 аналітичними методами рентгенівської дифрактометрії

Автор(и)

  • S.I. Drapak Photon-Quartz Design and Technology Ltd., Institute of Biology, Chemistry and Bioresources, Yuriy Fedkovych National University of Chernivtsi
  • S.V. Gavrylyuk Institute of Applied Mathematics and Fundamental Sciences, National University “Lviv Polytechnic”
  • Y.B. Khalavka Institute of Biology, Chemistry and Bioresources, Yuriy Fedkovych National University of Chernivtsi
  • V.D. Fotiy Photon-Quartz Design and Technology Ltd.
  • P.M. Fochuk Institute of Biology, Chemistry and Bioresources, Yuriy Fedkovych National University of Chernivtsi
  • O.I. Fediv Bukovinian State Medical University

DOI:

https://doi.org/10.15407/ujpe67.9.671

Ключові слова:

шаруватi кристали In2Se3, мiкроструктура, включення нанокристалiтiв, композити, аналiтичнi методи рентгенiвської дифрактометрiї

Анотація

Методом Брiджмена iз стехiометричного розплаву компонентiв вирощено шаруватi кристали In2Se3, якi, по даним рентгеноструктурного аналiзу, є неоднорiдними: частина зразкiв, отриманих iз одного i того ж зливку, мiстять у собi лише фазу гексагонального α-In2Se3, а в iншiй частинi виявлено включення кристалiчної фази In6Se7. Вкраплення бiльш вузькозонного напiвпровiдника в матрицю α-In2Se3 спричиняють струмову нестабiльнiсть iз Z- i N-подiбними вольт-амперними характеристиками, в той час як однофазнi зразки характеризуються лiнiйними залежностями струму вiд прикладеної напруги. Низка аналiтичних методiв рентгенiвської дифрактометрiї, залучених для встанов лення структури включень In6Se7, засвiдчує в них дiю стискувальних напружень, через яку середнi значення розмiру кристалiтiв In6Se7, визначенi за допомогою модифiкованого методу Шеррера, графiчного розмiрно-деформацiйного методу i методу Холдера–Вагнера з точнiстю, кращою нiж 1%, спiвпадають i становлять 26,5 нм. Обговорюються причини неспiвпадiння середнього розмiру нанокристалiтiв In6Se7, визначеного за методом Вiльямсона–Холла (23,13 нм), iз вищезазначеними розмiрами. За допомогою дифракцiйноадсорбцiйного методу знайдено середню масову частку фази In6Se7 в дослiджуваних зразках α-In2Se3 i, вiдповiдно, розраховано середню концентрацiю нанокристалiтiв In6Se7 iз середнiм розмiром 26,5 нм у шаруватiй α-In2Se3. Вбачається перспективнiсть використання композитних зразкiв In2Se3/In6Se7 для роботи в оптичному телекомунiкацiйному дiапазонi довжин хвиль.

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Опубліковано

2022-12-21

Як цитувати

Drapak, S., Gavrylyuk, S., Khalavka, Y., Fotiy, V., Fochuk, P., & Fediv, O. (2022). Характеристика наноструктурованих включень In6Se7 у шаруватих кристалах α-In2Se3 аналітичними методами рентгенівської дифрактометрії. Український фізичний журнал, 67(9), 671. https://doi.org/10.15407/ujpe67.9.671

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