Drapak, S.I., S.V. Gavrylyuk, Y.B. Khalavka, V.D. Fotiy, P.M. Fochuk, and O.I. Fediv. “Characterization of Nanostructured In6Se7 Inclusions in Layered α-In2Se3 Crystals Using Analytical X-Ray Diffractometry Methods”. Ukrainian Journal of Physics 67, no. 9 (December 21, 2022): 671. Accessed June 1, 2025. https://ujp.bitp.kiev.ua/index.php/upc/article/view/2021393.