Kraitchinskii, A.M., M.M. Kras’ko, A.G. Kolosiuk, R.V. Petrunya, V.Yu. Povarchuk, V.V. Voitovych, V.B. Neimash, V.A. Makara, and R.M. Rudenko. 2022. “Mechanism of Annealing of VO Defects in N-Si Under Pulse Electron Irradiation at High-Temperatures”. Ukrainian Journal of Physics 56 (9):922. https://doi.org/10.15407/ujpe56.9.922.