Laser-Induced Transformations in Thermally Evaporated Thin TlInSe2 Films Studied by Raman Spectroscopy
DOI:
https://doi.org/10.15407/ujpe68.12.816Keywords:
thin films, thermal evaporation, Raman spectroscopy, crystallisationAbstract
TlInSe2 films with thickness from 10 to 200 nm were thermally evaporated on silicon and silicate glass substrates. Micro-Raman spectra measured at a moderate excitation (532 nm, 4 kW/cm2) confirm the amorphous character of the films. Narrow features revealed in the spectra at an excitation power density of 40 kW/cm2 show the evidence for the formation of TlInSe2 , TlSe, and In2Se3 crystallites in the laser spot. For thin (10–30 nm) films, the rod-shaped TlInSe2 crystallites are shown to be oriented within the film plane. The crystallite formation is governed by the thermal effect of the tightly focused laser beam.
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