Vol. 64 No. 5 (2019)

UJP 2019 V64 #5

DOI: https://doi.org/10.15407/ujpe64.5

Published: 2019-06-21

Fields and elementary particles

Effects of Proximity Potentials on the Cross-Sections of 6,8He + 65Cu Halo Fusion Reactions

M. Aygun

363
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General physics

Propagation of the Measurement Error and the Measured Mean of a Physical Quantity for Elementary Functions ax and loga x

G. G. Rode

371
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Plasma physics

Specific Features of Microwave Methods for Dusty Plasma Diagnostics. I. Dielectric Permittivity, Refractive and Absorption Indices

Yu. V. Kovtun, A. I. Skibenko, E. I. Skibenko, Ye. V. Siusko

380
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Formation of Particles in Welding Fume Plasmas: Numerical Modeling and Experiment English

V. I. Vishnyakov, S. A. Kiro, M. V. Oprya, O. D. Chursina, A. A. Ennan

392
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Liquid crystals and polymers

Peculiarities of the Energy Transfer of Electronic Excitation in Carbazolyle-Containing Polymers

Yu. A. Skryshevski, A. Yu. Vakhnin

406
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Semiconductors and dielectrics

Photoelectric Properties of SiGe Films Covered with Amorphous- and Polycrystalline-Silicon Layers

V. Shmid, A. Podolian, A. Nadtochiy, O. Korotchenkov, B. Romanyuk, V. Melnik, V. Popov, O. Kosulya

415
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Influence of a Capping Ligand on the Band Gap and Excitonic Levels in Colloidal Solutions and Films of ZnSe Quantum Dots

N. V. Bondar, M. S. Brodyn, O. V. Tverdokhlibova, N. A. Matveevskaya, T. G. Beynik

425
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Optical and Electrical Properties of Tb–ZnO/SiO2 Structure in the Infrared Spectral Interval

O. V. Melnichuk, L. Yu. Melnichuk, N. O. Korsunska, L. Yu. Khomenkova, Ye. F. Venger

434
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Structure of materials

Ellipsometric Diagnostics of a Transient Surface Layer in Optical Glass

O. V. Makarenko, L. V. Poperenko, O. I. Zavalistyi, A. L. Yampolskiy

442
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