Investigation of Electrical Conductivity and Magnetoresistive Properties of Thin-Film Systems Based on Fe20Ni80 and SiO. Ukr. J. Phys. [Internet]. 2026 Oct. 29 [cited 2026 Oct. 29];71(11):909. Available from: https://ujp.bitp.kiev.ua/index.php/ujp/article/view/2024069