1.
Voitovych VV, Rudenko RM, Yuchymchuk VO, Voitovych MV, Krasko MM, Kolosiuk AG, Povarchuk VY, Khachevich IM, Rudenko MP. Effect of Tin on Structural Transformations in the Thin-Film Silicon Suboxide Matrix. Ukr. J. Phys. [Internet]. 2019 Jan. 4 [cited 2024 Mar. 28];61(11):980. Available from: https://ujp.bitp.kiev.ua/index.php/ujp/article/view/2019014