1.
Pavlyk Б, Lys Р, Hrypa А, Slobodzyan Д, Khvyshchun І, Shykoryak Й, Didyk Р. Radiation-induced Rearrangement of Defects in Silicon Crystals. Ukr. J. Phys. [Internet]. 2022 Feb. 17 [cited 2024 Sep. 1];56(1):64. Available from: https://ujp.bitp.kiev.ua/index.php/ujp/article/view/2022155