Zavalistyi OI, Makarenko OV, Odarych VA, Yampolskyi AL. The Structure of Oxide Film on the Porous Silicon Surface. Ukr. J. Phys. [Internet]. 2020 Feb. 3 [cited 2024 Dec. 22];65(1):75. Available from: https://ujp.bitp.kiev.ua/index.php/ujp/article/view/2019378