Kraitchinskii А.М., Kras’ko М.М., Kolosiuk А.Г., Petrunya Р.В., Povarchuk В.Ю., Voitovych В.В., Neimash В.Б., Makara В.А., and Rudenko Р.М. “Mechanism of Annealing of VO Defects in N-Si Under Pulse Electron Irradiation at High-Temperatures”. Ukrainian Journal of Physics 56, no. 9 (February 8, 2022): 922. Accessed November 24, 2024. https://ujp.bitp.kiev.ua/index.php/ujp/article/view/2022028.