Efremov, A. A., Litovchenko, V. G., Melnik, V. P., Oberemok, O. S., Popov, V. G. and Romanyuk, B. M. (2019) “Mechanisms of Dopant Depth Profile Modification During Mass Spectrometric Analysis of Multilayer Nanostructures”, Ukrainian Journal of Physics, 60(6), p. 511. doi: 10.15407/ujpe60.06.0511.