Drapak, S., Gavrylyuk, S., Khalavka, Y., Fotiy, V., Fochuk, P. and Fediv, O. (2022) “Characterization of Nanostructured In6Se7 Inclusions in Layered α-In2Se3 Crystals Using Analytical X-Ray Diffractometry Methods”, Ukrainian Journal of Physics, 67(9), p. 671. doi: 10.15407/ujpe67.9.671.