Efremov, A. A., V. G. Litovchenko, V. P. Melnik, O. S. Oberemok, V. G. Popov, and B. M. Romanyuk. 2019. “Mechanisms of Dopant Depth Profile Modification During Mass Spectrometric Analysis of Multilayer Nanostructures”. Ukrainian Journal of Physics 60 (6):511. https://doi.org/10.15407/ujpe60.06.0511.