STARYI, S.; LYSJUK, I.; GOLENKOV, O.; TSYBRII, Z.; DANILOV, S.; GUMENJUK-SICHEVSKA, J.; ANDRIEIEVA, K.; SMOLII, M.; SIZOV, F. Carrier Decay Lifetimes in the Narrow-gap Hg1–xCdxTe at the Interband and Intraband Excitations. Ukrainian Journal of Physics, [S. l.], v. 68, n. 8, p. 543, 2023. DOI: 10.15407/ujpe68.8.543. Disponível em: https://ujp.bitp.kiev.ua/index.php/ujp/article/view/2023114. Acesso em: 20 may. 2024.