Pavlyk Б.; Lys Р.; Hrypa А.; Slobodzyan Д.; Khvyshchun І.; Shykoryak Й.; Didyk Р. Radiation-induced Rearrangement of Defects in Silicon Crystals. Ukrainian Journal of Physics, [S. l.], v. 56, n. 1, p. 64, 2022. DOI: 10.15407/ujpe56.1.64. Disponível em: https://ujp.bitp.kiev.ua/index.php/ujp/article/view/2022155. Acesso em: 27 nov. 2022.