STUDENYAK, I. P.; KRANJČEC, M.; IZAI, V. Y.; STUDENYAK, V. I.; POP, M. M.; SUSLIKOV, L. M. Ellipsometric and Spectrometric Studies of (Ga0.2In0.8)2Se3 Thin Film. Ukrainian Journal of Physics, [S. l.], v. 65, n. 3, p. 231, 2020. DOI: 10.15407/ujpe65.3.231. Disponível em: https://ujp.bitp.kiev.ua/index.php/ujp/article/view/2019510. Acesso em: 23 apr. 2024.