ZAVALISTYI, O. I.; MAKARENKO, O. V.; ODARYCH, V. A.; YAMPOLSKYI, A. L. The Structure of Oxide Film on the Porous Silicon Surface. Ukrainian Journal of Physics, [S. l.], v. 65, n. 1, p. 75, 2020. DOI: 10.15407/ujpe65.1.75. Disponível em: https://ujp.bitp.kiev.ua/index.php/ujp/article/view/2019378. Acesso em: 6 feb. 2023.