NEIMASH, V.; DOVBESHKO, G.; SHEPELYAVYI, P.; DANKO, V.; MELNYK, V.; ISAIEV, M.; KUZMICH, A. Raman Scattering in the Process of Tin-Induced Crystallization of Amorphous Silicon. Ukrainian Journal of Physics, v. 61, n. 2, p. 143, 8 jan. 2019.