VOITOVYCH, V. V.; RUDENKO, R. M.; YUCHYMCHUK, V. O.; VOITOVYCH, M. V.; KRASKO, M. M.; KOLOSIUK, A. G.; POVARCHUK, V. Y.; KHACHEVICH, I. M.; RUDENKO, M. P. Effect of Tin on Structural Transformations in the Thin-Film Silicon Suboxide Matrix. Ukrainian Journal of Physics, [S. l.], v. 61, n. 11, p. 980, 2019. DOI: 10.15407/ujpe61.11.0980. Disponível em: https://ujp.bitp.kiev.ua/index.php/ujp/article/view/2019014. Acesso em: 20 apr. 2024.