VENGER, E. F.; MELNICHUK, L. Y.; MELNICHUK, A. V.; SEMIKINA, T. V. IR Spectroscopic Study of Thin ZnO Films Grown Using the Atomic Layer Deposition Method. Ukrainian Journal of Physics, [S. l.], v. 61, n. 12, p. 1053, 2019. DOI: 10.15407/ujpe61.12.1053. Disponível em: https://ujp.bitp.kiev.ua/index.php/ujp/article/view/2019006. Acesso em: 19 apr. 2024.