SHMID, V.; PODOLIAN, A.; NADTOCHIY, A.; KOROTCHENKOV, O.; ROMANYUK, B.; MELNIK, V.; POPOV, V.; KOSULYA, O. Photoelectric Properties of SiGe Films Covered with Amorphous- and Polycrystalline-Silicon Layers. Ukrainian Journal of Physics, [S. l.], v. 64, n. 5, p. 415, 2019. DOI: 10.15407/ujpe64.5.415. Disponível em: https://ujp.bitp.kiev.ua/index.php/ujp/article/view/2018573. Acesso em: 25 apr. 2024.