GAMOV, D. V. et al. Research of Recombination Characteristics of Cz-Si Implanted with Iron Ions. Ukrainian Journal of Physics, [S. l.], v. 58, n. 9, p. 881, 2018. DOI: 10.15407/ujpe58.09.0881. Disponível em: https://ujp.bitp.kiev.ua/index.php/ujp/article/view/2018365. Acesso em: 3 jul. 2025.