NEIMASH, V. B.; POROSHIN, V. M.; KABALDIN, A. M.; YUKHYMCHUK, V. O.; SHEPELYAVYI, P. E.; MAKARA, V. A.; LARKIN, S. Y. Microstructure of thin Si–Sn Composite Films. Ukrainian Journal of Physics, [S. l.], v. 58, n. 9, p. 865, 2018. DOI: 10.15407/ujpe58.09.0865. Disponível em: https://ujp.bitp.kiev.ua/index.php/ujp/article/view/2018363. Acesso em: 22 apr. 2024.