PAVLYK, B. V.; KUSHLYK, M. O.; DIDYK, R. I.; SHYKORJAK, Y. A.; SLOBODZYAN, D. P.; KULYK, B. Y. Electrophysical Characteristics of Near-Surface Layers in p-Si Crystals with Sputtered Al Films and Subjected to Elastic Deformation. Ukrainian Journal of Physics, [S. l.], v. 58, n. 8, p. 742, 2018. DOI: 10.15407/ujpe58.08.0742. Disponível em: https://ujp.bitp.kiev.ua/index.php/ujp/article/view/2018346. Acesso em: 27 apr. 2024.