SOROKA, V. I.; LEBED, S. O.; TOLMACHOV, M. G.; KUKHARENKO, O. G.; VESELOV, O. O. Nuclear Microanalysis Study of Surface Nanolayers in Gold–Silicon Structures. Ukrainian Journal of Physics, [S. l.], v. 58, n. 4, p. 311, 2018. DOI: 10.15407/ujpe58.04.0311. Disponível em: https://ujp.bitp.kiev.ua/index.php/ujp/article/view/2018296. Acesso em: 20 apr. 2024.