SACHENKO, A. V.; KOSTYLYOV, V. P.; LITOVCHENKO, V. G.; POPOV, V. G.; ROMANYUK, B. M.; CHERNENKO, V. V.; NASEKA, V. M.; SLUSAR, T. V.; KYRYLOVA, S. I.; KOMAROV, F. F. Recombination Characteristics of Single-Crystalline Silicon Wafers with a Damaged Near-Surface Layer. Ukrainian Journal of Physics, [S. l.], v. 58, n. 2, p. 142, 2018. DOI: 10.15407/ujpe58.02.0142. Disponível em: https://ujp.bitp.kiev.ua/index.php/ujp/article/view/2018278. Acesso em: 25 apr. 2024.