SACHENKO, A. V. et al. Recombination Characteristics of Single-Crystalline Silicon Wafers with a Damaged Near-Surface Layer. Ukrainian Journal of Physics, [S. l.], v. 58, n. 2, p. 142, 2018. DOI: 10.15407/ujpe58.02.0142. Disponível em: https://ujp.bitp.kiev.ua/index.php/ujp/article/view/2018278. Acesso em: 21 apr. 2025.