EFREMOV, A. A.; LITOVCHENKO, V. G.; MELNIK, V. P.; OBEREMOK, O. S.; POPOV, V. G.; ROMANYUK, B. M. Mechanisms of Dopant Depth Profile Modification During Mass Spectrometric Analysis of Multilayer Nanostructures. Ukrainian Journal of Physics, [S. l.], v. 60, n. 6, p. 511, 2019. DOI: 10.15407/ujpe60.06.0511. Disponível em: https://ujp.bitp.kiev.ua/index.php/ujp/article/view/2019221. Acesso em: 22 nov. 2024.