ZAINABIDINOV, S.; MAMATKARIMOV, O. O.; KHIMMATKULOV, O.; TURSUNOV, I. G. Influence of Deep-Level Impurities on the Strain Electric Properties of Monocrystalline Silicon. Ukrainian Journal of Physics, [S. l.], v. 62, n. 11, p. 957, 2018. DOI: 10.15407/ujpe62.11.0957. Disponível em: https://ujp.bitp.kiev.ua/index.php/ujp/article/view/2018609. Acesso em: 23 nov. 2024.