GEMECHU, N.; ABEBE, T. Structural Characterization and Thickness Profile of Pulsed Laser-Deposited KY3F10: Ho3+ Thin Films: Pulsed laser deposition of thin films. Ukrainian Journal of Physics, [S. l.], v. 63, n. 2, p. 182, 2018. DOI: 10.15407/ujpe63.2.182. Disponível em: https://ujp.bitp.kiev.ua/index.php/ujp/article/view/71. Acesso em: 21 nov. 2024.