DRAPAK, S.; GAVRYLYUK, S.; KHALAVKA, Y.; FOTIY, V.; FOCHUK, P.; FEDIV, O. Characterization of Nanostructured In6Se7 Inclusions in Layered α-In2Se3 Crystals Using Analytical X-Ray Diffractometry Methods. Ukrainian Journal of Physics, [S. l.], v. 67, n. 9, p. 671, 2022. DOI: 10.15407/ujpe67.9.671. Disponível em: https://ujp.bitp.kiev.ua/index.php/ujp/article/view/2021393. Acesso em: 21 nov. 2024.