DRAPAK, S.I.; GAVRYLYUK, S.V.; KHALAVKA, Y.B.; FOTIY, V.D.; FOCHUK, P.M.; FEDIV, O.I. Characterization of Nanostructured In6Se7 Inclusions in Layered α-In2Se3 Crystals Using Analytical X-Ray Diffractometry Methods. Ukrainian Journal of Physics, [S. l.], v. 67, n. 9, p. 671, 2022. DOI: 10.15407/ujpe67.9.671. Disponível em: https://ujp.bitp.kiev.ua/index.php/ujp/article/view/2021393. Acesso em: 11 may. 2025.