AL-ADAMAT, K.; EL-NASSER, H. Characterization of Cobalt Phthalocyanine Thin Film on Silicon Substrate Using Spectroscopic Ellipsometry. Ukrainian Journal of Physics, [S. l.], v. 66, n. 7, p. 562, 2021. DOI: 10.15407/ujpe66.7.562. Disponível em: https://ujp.bitp.kiev.ua/index.php/ujp/article/view/2020223. Acesso em: 27 sep. 2024.