GORIACHKO, A.; KULYK, S. P.; MELNIK, P. V.; NAKHODKIN, M. G. Scanning Tunneling Microscopy Investigation of the Si(001)-c(8 × 8) Nanostructured Surface. Ukrainian Journal of Physics, [S. l.], v. 60, n. 2, p. 148, 2019. DOI: 10.15407/ujpe60.02.0148. Disponível em: https://ujp.bitp.kiev.ua/index.php/ujp/article/view/2019274. Acesso em: 22 nov. 2024.