Voitovych, V.V., Rudenko, R.M., Yuchymchuk, V.O., Voitovych, M.V., Krasko, M.M., Kolosiuk, A.G., Povarchuk, V.Y., Khachevich, I.M. and Rudenko, M.P. 2019. Effect of Tin on Structural Transformations in the Thin-Film Silicon Suboxide Matrix. Ukrainian Journal of Physics. 61, 11 (Jan. 2019), 980. DOI:https://doi.org/10.15407/ujpe61.11.0980.