Sachenko, A.V., Kostylyov, V.P., Litovchenko, V.G., Popov, V.G., Romanyuk, B.M., Chernenko, V.V., Naseka, V.M., Slusar, T.V., Kyrylova, S.I. and Komarov, F.F. 2018. Recombination Characteristics of Single-Crystalline Silicon Wafers with a Damaged Near-Surface Layer. Ukrainian Journal of Physics. 58, 2 (Oct. 2018), 142. DOI:https://doi.org/10.15407/ujpe58.02.0142.