Laser-Induced Transformations in Thermally Evaporated Thin TlInSe2 Films Studied by Raman Spectroscopy

Authors

  • Y.M. Azhniuk Institute of Electron Physics, Nat. Acad. of Sci. of Ukraine
  • A.V. Gomonnai Institute of Electron Physics, Nat. Acad. of Sci. of Ukraine, Uzhhorod National University
  • V.V. Lopushansky Institute of Electron Physics, Nat. Acad. of Sci. of Ukraine
  • O.O. Gomonnai Uzhhorod National University
  • T. Babuka Uzhhorod National University
  • V.Y. Loya Institute of Electron Physics, Nat. Acad. of Sci. of Ukraine
  • I.M. Voynarovych Institute of Electron Physics, Nat. Acad. of Sci. of Ukraine

DOI:

https://doi.org/10.15407/ujpe68.12.816

Keywords:

thin films, thermal evaporation, Raman spectroscopy, crystallisation

Abstract

TlInSe2 films with thickness from 10 to 200 nm were thermally evaporated on silicon and silicate glass substrates. Micro-Raman spectra measured at a moderate excitation (532 nm, 4 kW/cm2) confirm the amorphous character of the films. Narrow features revealed in the spectra at an excitation power density of 40 kW/cm2 show the evidence for the formation of TlInSe2 , TlSe, and In2Se3 crystallites in the laser spot. For thin (10–30 nm) films, the rod-shaped TlInSe2 crystallites are shown to be oriented within the film plane. The crystallite formation is governed by the thermal effect of the tightly focused laser beam.

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Published

2024-01-06

How to Cite

Azhniuk, Y., Gomonnai, A., Lopushansky, V., Gomonnai, O., Babuka, T., Loya, V., & Voynarovych, I. (2024). Laser-Induced Transformations in Thermally Evaporated Thin TlInSe2 Films Studied by Raman Spectroscopy. Ukrainian Journal of Physics, 68(12), 816. https://doi.org/10.15407/ujpe68.12.816

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Section

Semiconductors and dielectrics

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