Development of Neutron Reflectometry of Surface Layers of Liquid Systems


  • Y. Kosiachkin Physics Department, Taras Shevchenko National University of Kyiv
  • L.A. Bulavin Physics Department, Taras Shevchenko National University of Kyiv
  • P. Kopcansky Institute of Experimental Physics Slovak Academy of Science



thin films, multilayered structures, neutron reflectometry, X-ray reflectometry, electrochemical interfaces, signal optimization


In order to develop the methods of neutron and X-ray reflectometries for the study of surface layers of liquid systems, a method of increasing the sensitivity of the reflectometric experiment to the appearance and evolution of near-surface layers is proposed. Therefore, Ni/Ti multilayered heterostructures are tested regarding for the practical applicability of the quasi-homogeneous approach with varying effective scattering length density of thin (thickness <100 nm) metal films in X-ray reflectometry experiments on the example of electrochemical interfaces. The structures with extremely low thickness of the Ni/Ti bilayer with different thickness ratios of Ni- and Ti-sublayers are synthesized by magnetron sputtering. Specular reflectivities of X-rays from the heterostructures are analyzed to conclude about the limits of the quasi-homogeneous approximation.


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How to Cite

Kosiachkin, Y., Bulavin, L., & Kopcansky, P. (2023). Development of Neutron Reflectometry of Surface Layers of Liquid Systems. Ukrainian Journal of Physics, 68(4), 259.



Physics of liquids and liquid systems, biophysics and medical physics

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