Materials for Optical Sensors of X-ray Irradiation Based on (GaxIn1 – x)2Se3 Films

Authors

  • M.M. Pop Department of Applied Physics, Faculty of Physics, Uzhhorod National University, Institute of Information Registration Problems, Nat. Acad. of Sci. of Ukraine
  • V.S. Bilanych Department of Applied Physics, Faculty of Physics, Uzhhorod National University
  • V. Komanicky Faculty of Science, Saf´arik University
  • I.I. Nebola Department of Applied Physics, Faculty of Physics, Uzhhorod National University
  • A.M. Solomon Institute of Electron Physics, Nat. Acad. of Sci. of Ukraine
  • P. Kopčanský Institute of Experimental Physics
  • I.P. Studenyak Department of Applied Physics, Faculty of Physics, Uzhhorod National University

DOI:

https://doi.org/10.15407/ujpe67.9.684

Keywords:

film, spectral ellipsometry, transmission spectra, X-ray irradiation, energy pseudogap, refractive index

Abstract

(GaxIn1-x)2Se3 films with 0.1 ≤ x ≤ 0.4 were deposited by the thermal evaporation technique. As-deposited (GaxIn1-x)2Se3 films were irradiated using the wideband radiation of a Cu-anode X-ray tube at different exposure times. The spectral dependences of the refractive index and extinction coefficient are measured by the spectral ellipsometry technique. The optical transmission spectra of X-ray irradiated (GaxIn1-x)2Se3 films are studied for various irradiation times. Parameters of the Urbach absorption edge for X-ray-irradiated (GaxIn1-x)2Se3 thin films are determined and compared with those of non-irradiated films. The spectral dependences of the refractive indices of non-irradiated and X-ray-irradiated (GaxIn1-x)2Se3 films are described in the framework of the model developed by Cauchy, Sellmeier, Wemple, and DiDomenico, as well as by the optical-refractometric relation. The detailed variation of the parameters of the Wemple–DiDomenico model for non-irradiated and X-ray-irradiated (GaxIn1-x)2Se3 films has been analyzed. The perspective of applications of (GaxIn1-x)2Se3 films as the materials for optical sensors of X-rays is discussed.

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Published

2022-12-21

How to Cite

Pop, M., Bilanych, V., Komanicky, V., Nebola, I., Solomon, A., Kopčanský, P., & Studenyak, I. (2022). Materials for Optical Sensors of X-ray Irradiation Based on (GaxIn1 – x)2Se3 Films. Ukrainian Journal of Physics, 67(9), 684. https://doi.org/10.15407/ujpe67.9.684

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Section

Semiconductors and dielectrics

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