Deformation Potential Constants Ξu and Ξd in n-Si Determined with the Use of the Tensoresistance Effect

Authors

  • S.V. Luniov Lutsk National Technical University
  • L.I. Panasiuk Lutsk National Technical University
  • S.A. Fedosov Lesya Ukrainka Volyn National University

DOI:

https://doi.org/10.15407/ujpe57.6.636

Keywords:

-

Abstract

On the basis of longitudinal piezoresistance measurements in the geometry X J ║ [100] and the theory of anisotropic scattering, the deformation potential constants Ξu and Ξd for γ-irradiated n-Si have been determined. It has been shown that, while determining the anisotropy of relaxation times for n-Si with the deep energy level Ec – 0.17 eV, the dependence of the concentration of deep ionized centers on the deformation must be taken into consideration.

References

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Published

2012-06-30

How to Cite

Luniov С., Panasiuk Л., & Fedosov С. (2012). Deformation Potential Constants Ξu and Ξd in n-Si Determined with the Use of the Tensoresistance Effect. Ukrainian Journal of Physics, 57(6), 636. https://doi.org/10.15407/ujpe57.6.636

Issue

Section

Solid matter