Polymer Composites with Improved Dielectric Properties: A Review

Authors

  • B. Ghule Symbiosis Institute of Technology (SIT), Symbiosis International (Deemed University) (SIU)
  • M. Laad Symbiosis Institute of Technology (SIT), Symbiosis International (Deemed University) (SIU)

DOI:

https://doi.org/10.15407/ujpe66.2.166

Keywords:

polymer composites, dielectric constant, dielectric strength, ceramic filler, energy storage

Abstract

Materials exhibiting high dielectric constant (k) values find applications in capacitors, gate dielectrics, dielectric elastomers, energy storage device, while materials with low dielectric constant are required in electronic packaging and other such applications. Traditionally, high k value materials are associated with high dielectric losses, frequency-dependent dielectric behavior, and high loading of a filler. Materials with low k possess a low thermal conductivity. This creates the new challenges in the development of dielectric materials in both kinds of applications. Use of high dielectric constant filler materials increases the dielectric constant. In this study,the factors affecting the dielectric constant and the dielectric strength of polymer composites are explored. The present work aims to study the effect of various parameters affecting the dielectric properties of the materials. The factors selected in this study are the type of a polymer, type of a filler material used, size, shape, loading level and surface modification of a filler material, and method of preparation of the polymer composites. The study is focused on the dielectric enhancement of polymer nanocomposites used in the field of energy storage devices. The results show that the core-shell structured approach for high dielectric constant materials incorporated in a polymer matrix improves the dielectric constant of the polymer composite.

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Published

2021-03-04

How to Cite

Ghule, B., & Laad, M. (2021). Polymer Composites with Improved Dielectric Properties: A Review. Ukrainian Journal of Physics, 66(2), 166. https://doi.org/10.15407/ujpe66.2.166

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Section

Semiconductors and dielectrics