Peculiarities of Current Flow in Strongly Compensated Low-Resistance CdTe:Cl Crystals under Ultrasonic Loading

Authors

  • Ya. M. Olikh V.E. Lashkaryov Institute of Semiconductor Physics, Nat. Acad. of Sci. of Ukraine
  • M. D. Tymochko V.E. Lashkaryov Institute of Semiconductor Physics, Nat. Acad. of Sci. of Ukraine

DOI:

https://doi.org/10.15407/ujpe61.05.0381

Keywords:

ultrasound, dislocations, CdTe single crystals, Hall effect, conductivity relaxation

Abstract

To elucidate the mechanism of influence of ultrasound on the temperature, T, dependence of conductivity (q(T)) in low-resistance CdTe:Cl (NCl ≈ 1024 m−3) single crystals of the n-type, the Hall effect and the relaxation kinetics of q(t) at the ultrasound (fUS ∼ 10 MHz, WUS ∼ 104 W/m2) switching-on and -off have been studied in a temperature interval from 77 to 300 K. A completely reversible dynamical influence of ultrasound is revealed for the first time. It has different characters for the low (LT, T < 180 K) and high (HT, T > 200 K) temperature intervals. Acoustically stimulated changes in the HT region are found to be in-significant: the mobility of charge carriers decreases a little, and long-term processes of q(t) relaxation are not observed. In the LT region, the relative acoustically stimulated changes grow; in particular, the duration of q(t) relaxation processes increases, and they reveal a two-stage character. To explain this phenomenon, the model of a heterogeneous semiconductor containing clusters of impurity defects in vicinities of dislocations is applied. A mechanism is proposed that relates the “instant” increase of q(t) with the acoustically stimulated reduction of the amplitude of fluctuations of the large-scale potential owing to the enlargement of the effective electronic radius of dislocation impurity clusters. Long-term (50–500 s) temperature-dependent relaxation processes are governed by the diffusive reconstruction of the point-defect structure in the cluster bulk, including the transformation of acceptor (V2−CdCl+Te)− complexes into neutral (V2−Cd2Cl+Te)0 ones.

References

I.V. Ostrovs'kyi and A.A. Korotchenkov. Acoustooptics (Vyshcha Shkola, Kyiv, 2003) (in Ukrainian).

S. Ostapenko, N.E. Korsunskaya, and M.K. Sheinkman, Solid State Phenom. 85–86, 317 (2002). https://doi.org/10.4028/www.scientific.net/SSP.85-86.317

O.Ya. Olikh, Ultrasonics 56, 545 (2015). https://doi.org/10.1016/j.ultras.2014.10.008

Ya.M. Olikh and O.Ya. Olikh, Sensor. Elektron. Mikrosyst. Tekhnol. 1, 19 (2004).

A.I. Vlasenko, Ya.M. Olikh, and R.K. Savkina, Fiz. Tekh. Poluprovodn. 33, 410 (1999).

B.N. Babentsov, S.I. Gorban', I.Ya. Gorodetskii et al., Fiz. Tekh. Poluprovodn. 25, 1243 (1991).

D.V. Korbutyak, S.W. Mel'nychuk, E.V. Korbut, and M.M. Borysyk, Cadmium Telluride: Impurity-Defect States and Detector Properties (Ivan Fedorov, Kyiv, 2000) (in Ukrainian).

V.I. Khivrych, Effects of Compensation and Ionizing Radiation in CdTe Single Crystals (Institute for Nuclear Research, Kyiv, 2010) (in Ukrainian).

M.V. Alekseenko, E.N. Arkadyeva, and A.A. Matveev, Fiz. Tekh. Poluprovodn. 4, 414 (1970).

N.V. Agrinskaya, E.N. Arkadyeva, and A.I. Terentyev, Fiz. Tekh. Poluprovodn. 23, 231 (1989).

N.V. Agrinskaya, M.V. Alekseenko, E.N. Arkadyeva et al., Fiz. Tekh. Poluprovodn. 9, 320 (1975).

N.V. Agrinskaya and V.V. Shashkova, Fiz. Tekh. Poluprovodn. 24, 697 (1990).

N.V. Agrinskaya and A.N. Alyoshin, Fiz. Tverd. Tela 31, 277 (1989).

N.V. Agrinskaya and V.I. Kozub, Fiz. Tekh. Poluprovodn. 32, 703 (1998).

Electronic Properties of Dislocations in Semiconductors, edited by Yu.A. Osipyan (Editorial URSS, Moscow, 2000) (in Russian).

V.B. Shikin and Yu.V. Shikina, Usp. Fiz. Nauk 165, 887 (1995). https://doi.org/10.3367/UFNr.0165.199508b.0887

M. Reiche, M. Kittler, W. Erfurt et al., J. Appl. Phys. 115, 194303 (2014). https://doi.org/10.1063/1.4876265

A.A. Matveev and A.I. Terentyev, Fiz. Tekh. Poluprovodn. 34, 1316 (2000).

Ya.M. Olikh and N.D. Timochko, in Proceedings of the 4th International Conference ISMART 2014 (Belorus. Gos. Univ. Publ. Center, Minsk, 2014), p. 112 (in Russian).

M.I. Ilashchuk, A.A. Parfenyuk, and K.S. Ulyanitskyi, Ukr. Fiz. Zh. 31, 126 (1986).

Ya.M. Olikh and R.K. Savkina, Ukr. Fiz. Zh. 42, 1385 (1997).

Ya.M. Olikh and M.D. Tymochko, Techn. Phys. Lett. 37, 37 (2011). https://doi.org/10.1134/S106378501101007X

Physics of A II B VI compounds, edited by A.N. Georgobiani and M.K. Sheikman (Nauka, Moscow,1986) (in Russian).

V.L. Bonch-Bruevich and S.G. Kalashnikov, Semiconductor Physics (Nauka, Moscow, 1977) (in Russian).

M.K. Sheinkman and A.Ya. Shik, Fiz. Tekh. Poluprovodn. 10, 209 (1976).

I.A. Gerko, V.I. Khrupa, V.P.Klad'ko, E.N. Kislovskii, and V.N. Merinov, Zavodsk. Laborat. 54, 65 (1988).

L.R. Weisberg, J. Appl. Phys. 33, 1817 (1962). https://doi.org/10.1063/1.1728839

E.D. Golovkina, N.N. Levchenya, and A.Ya. Shik, Fiz. Tekh. Poluprovodn. 10, 383 (1976).

B.I. Shklovskii and A.L. Efros, Electronic Properties of Doped Semiconductors (Springer, Berlin, 1984). https://doi.org/10.1007/978-3-662-02403-4

N.A. Poklonskii, Ionization Equilibrium and Hopping Conductivity in Doped Semiconductors (Belorus. Gos. Univ. Publ. House, Minsk, 2004) (in Russian).

M.M. Baran, I.M. Vas'kovych, Nauk. Visn. NLTU 22.15, 336 (2012).

S.A. Omel'chenko, A.A. Gorban', M.F. Bulanyi, and A.A. Timofeev, Fiz. Tverd. Tela 48, 830 (2006).

Ultrasound. The Small Encyclopedia, edited by I.P. Golyamina (Soviet Encyclopedia, Moscow, 1979) (in Russian).

V.N. Pavlovich, Phys. Status Solidi B 180, 97 (1993). https://doi.org/10.1002/pssb.2221800108

Published

2019-01-06

Issue

Section

Solid matter

How to Cite

Peculiarities of Current Flow in Strongly Compensated Low-Resistance CdTe:Cl Crystals under Ultrasonic Loading. (2019). Ukrainian Journal of Physics, 61(5), 381. https://doi.org/10.15407/ujpe61.05.0381

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