PAVLYK, B.V.; LYS, R.M.; HRYPA, A.S.; SLOBODZYAN, D.P.; KHVYSHCHUN, I.O.; SHYKORYAK, I.A.; DIDYK, R.I. Radiation-induced Rearrangement of Defects in Silicon Crystals. Ukrainian Journal of Physics, [S. l.], v. 56, n. 1, p. 64, 2022. DOI: 10.15407/ujpe56.1.64. Disponível em: https://ujp.bitp.kiev.ua/index.php/uaa/article/view/2022155. Acesso em: 7 apr. 2025.